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Standardless EDS Quantitative Analysis at High Tilt Angles

Published online by Cambridge University Press:  01 August 2002

A.O. Sandborg ,
R.A. Anderhalt ,
J. M. Dijkstra  and
R. B. Shen
A.O. Sandborg
Affiliation:
EDAX, Inc. 85 McKee Drive, Mahwah, NJ 07430
R.A. Anderhalt
Affiliation:
EDAX, Inc. 85 McKee Drive, Mahwah, NJ 07430
J. M. Dijkstra
Affiliation:
EDAX Europe, Ringbaan Noord 103, 5046 AA Tilburg, The Netherlands
R. B. Shen
Affiliation:
EDAX, Inc. 85 McKee Drive, Mahwah, NJ 07430

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 8 , Issue S02 , August 2002 , pp. 1468 - 1469
Copyright
Copyright © Microscopy Society of America 2002