Hostname: page-component-78c5997874-j824f Total loading time: 0 Render date: 2024-11-09T22:58:59.513Z Has data issue: false hasContentIssue false
  • English
  • Français

Attaining High Count Rates and X-Ray Mapping for the SDD

Published online by Cambridge University Press:  05 August 2007

R Anderhalt ,
D Redfern  and
A Sandborg
R Anderhalt
Affiliation:
EDAX Inc
D Redfern
Affiliation:
EDAX Inc
A Sandborg
Affiliation:
EDAX Inc
Get access

Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Type
Research Article
Information
Microscopy and Microanalysis , Volume 13 , Issue S02 , August 2007 , pp. 1362 - 1363
Copyright
© 2007 Microscopy Society of America

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)