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Understanding GaAs Native Oxides By Correlating Three Liquid Contact Angle Analysis (3LCAA) and High Resolution Ion Beam Analysis (HR-IBA) to X-Ray Photoelectron Spectroscopy (XPS) as Function of Surface Processing — ERRATUM

Published online by Cambridge University Press:  14 October 2019

Sukesh Ram ,
Amber A. Chow ,
Shaurya Khanna ,
Nikhil C. Suresh ,
Franscesca J. Ark ,
Saaketh R. Narayan ,
Aashi R. Gurijala ,
Jack M. Day ,
Timothy Karcher  and
Robert J. Culbertson
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Abstract

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Type
Erratum
Information
MRS Advances , Volume 4 , Issue 41-42: Electronics and Photonics , 2019 , pp. 2307
Copyright
Copyright © Materials Research Society 2019 

References

Reference:

Ram, S., Chow, A.A., Khanna, S., Suresh, N.C., Ark, F.J., Narayan, S.R., Gurijala, A.R., Day, J.M., Karcher, T., Culbertson, R.J., Whaley, S.D., Kavanagh, K.L., and Herbots, N., MRS Advances 1 (2019).CrossRefGoogle Scholar