Research Article
Detection and characterization of stacking faults by light beam induced current mapping and scanning infrared microscopy in silicon*
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- 15 August 1998, pp. 123-126
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Relaxation phenomenon in composite materials
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- Published online by Cambridge University Press:
- 15 August 1998, pp. 127-134
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De la nécessité d'une fine couche de nickel pour obtenir des couches minces de MoSe2 photoconductrices
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- 15 August 1998, pp. 135-139
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Couches minces supraconductrices à haute température critique pour l'électronique*
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- 15 August 1998, pp. 141-147
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Structural modifications induced by electronic energy loss in Ni3B irradiated with GeV heavy ions*
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- 15 August 1998, pp. 149-158
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Characterization and realization of a 120 kV, 200 ns transmission line pulse generator
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- 15 August 1998, pp. 159-167
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Printed circuit board (PCB) model using the thin-wire method to compute conducted EMI in power electronic systems
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- 15 August 1998, pp. 169-181
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Diffraction peak shift in MgO small crystallites
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- 15 August 1998, pp. 183-186
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Réponse d'un échantillon métallique à structure fractale à une excitation électrique à fréquence variable*
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- 15 August 1998, pp. 187-193
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Vers une méthode de réglage expérimentale des commandes PID floues : application aux systèmes électromécaniques
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- 15 August 1998, pp. 195-214
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Experimental study of the transmission of breakdown plasma generated during laser shock processing
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- 15 August 1998, pp. 215-218
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The investigation of DC electrical discharges by the laser-gas interaction
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- Published online by Cambridge University Press:
- 15 August 1998, pp. 219-232
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