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Wavelet analysis of near-field data and the resolution problem*

Published online by Cambridge University Press:  15 March 1999

D. Barchiesi  and
T. Gharbi
D. Barchiesi
Affiliation:
Laboratoire d'Optique P.M. Duffieux (UMR 6603 CNRS), Université de Franche-Comté, Institut des Microtechniques, 25030 Besançon Cedex, France
T. Gharbi*
Affiliation:
CERAH, Laboratoire d'Optique P.M. Duffieux (UMR 6603 CNRS), Université de Franche-Comté, Institut des Microtechniques, 25030 Besançon Cedex, France
*
[email protected]
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Abstract

In Near-Field Optical microscopy, the resolution isdirectly related to the experimental conditions of illuminationand separation between tip and sample. In general, there is nowell-defined linear transfer function of the measurement system.The local resolution can be described by the signal-to-noiseratio, by the separation of individual objects or in terms of datashape sharpness. In this paper we use wavelet analysis todetermine local resolution. We deduce the resolution from thecharacteristics of the wavelet and with the help of the localenergy in the decomposition.

Keywords

Type
Research Article
Information
The European Physical Journal - Applied Physics , Volume 5 , Issue 3 , March 1999 , pp. 297 - 301
Copyright
© EDP Sciences, 1999

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Footnotes

*

Thispaper was presented at the special CFMCP colloquium held at Strasbourg-Illkirch theJuly 1st-3rd, 1998.

References

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