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Preparation and characterization of sprayed FTO thin films

Published online by Cambridge University Press:  13 June 2007

M. Abd-Lefdil ,
R. Diaz ,
H. Bihri ,
M. Ait Aouaj  and
F. Rueda
M. Abd-Lefdil*
Affiliation:
Laboratoire de Physique des Matériaux, Université Mohammed V, Agdal, Rabat, Morocco
R. Diaz
Affiliation:
Departamento de Física Aplicada C-XII, Universidad Autónoma de Madrid, Madrid, Spain
H. Bihri
Affiliation:
Laboratoire de Physique des Matériaux, Université Mohammed V, Agdal, Rabat, Morocco
M. Ait Aouaj
Affiliation:
Laboratoire de Physique des Matériaux, Université Mohammed V, Agdal, Rabat, Morocco
F. Rueda
Affiliation:
Departamento de Física Aplicada C-XII, Universidad Autónoma de Madrid, Madrid, Spain
*
[email protected]
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Abstract

Fluorine doped tin oxide (FTO) thin films have been prepared by spray pyrolysis technique with no further annealing. Films with 2.5% of fluorine grown at 400 °C present a single phase and exhibit a tetragonal structure with lattice parameters a = 4.687 Å and c = 3.160 Å. Scanning electron micrographs showed homogeneous surfaces with average grain size around 190 nm. The films are transparent in the visible zone and exhibit a high reflectance in the near infrared region. The best electrical resistivity was 6.3 × 10-4 Ω cm for FTO with 2.5% of fluorine. The ratio of transmittance in the visible to the sheet resistance are in the 0.57 × 10-2–1.96 × 10-2 Ω-1 range.

Keywords

Type
Research Article
Information
The European Physical Journal - Applied Physics , Volume 38 , Issue 3 , June 2007 , pp. 217 - 219
Copyright
© EDP Sciences, 2007

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