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Perturbing effects of the probe support on the calibration of electric field meters

Published online by Cambridge University Press:  30 April 2008

O. Bottauscio ,
M. Chiampi ,
G. Crotti  and
L. Zilberti
O. Bottauscio
Affiliation:
Istituto Nazionale di Ricerca Metrologica (INRIM), Strada delle Cacce 91, 10135 Torino, Italy
M. Chiampi
Affiliation:
Dipartimento di Ingegneria Elettrica, Politecnico di Torino, Corso Duca degli Abruzzi 24, 10129 Torino, Italy
G. Crotti*
Affiliation:
Istituto Nazionale di Ricerca Metrologica (INRIM), Strada delle Cacce 91, 10135 Torino, Italy
L. Zilberti
Affiliation:
Dipartimento di Ingegneria Elettrica, Politecnico di Torino, Corso Duca degli Abruzzi 24, 10129 Torino, Italy
*
[email protected]
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Abstract

This paper aims at investigating the influence of the dielectric support on the indications of single axis and three-axis low frequency electric field meters obtained during their calibration. The modification of the calibration field due to the dielectric support, experienced by the meter probe, is predicted by a Boundary Element model and experimentally compared with the actual probe indication, considering both a parallel plate set-up and a TEM cell for the generation of the reference field. The perturbing effect, estimated for different dielectric supports, is found to be greatly amplified and frequency dependent when considering lossy dielectric materials.

Keywords

Type
Research Article
Information
The European Physical Journal - Applied Physics , Volume 42 , Issue 3 , June 2008 , pp. 345 - 350
Copyright
© EDP Sciences, 2008

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References

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