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Optical properties of CdI2 thin films

Published online by Cambridge University Press:  15 September 2000

A. E. Bekheet ,
M. A. M. Seyam ,
F. M. Sallam  and
H. T. El-Shair
A. E. Bekheet*
Affiliation:
Physics Department, Faculty of Education, Ain Shams University, Cairo, Egypt
M. A. M. Seyam
Affiliation:
Physics Department, Faculty of Education, Ain Shams University, Cairo, Egypt
F. M. Sallam
Affiliation:
Physics Department, Faculty of Education, Ain Shams University, Cairo, Egypt
H. T. El-Shair
Affiliation:
Physics Department, Faculty of Education, Ain Shams University, Cairo, Egypt
*
[email protected]
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Abstract

The transmittance (T) of thin films of CdI2, prepared by thermal evaporation technique on quartz substrates,have been measured over the wavelength range 200−900 nm. Fromanalysis of the transmittance data, the optical constants, therefractive index (n) and the extinction coefficient (k), havebeen studied. Analysis of the refractive index (n) yields a lowfrequency dielectric constant, average oscillator strength and average oscillator energy. From analysis of the absorptioncoefficient (α), the fundamental absorption edge can bedetermined. Both allowed direct transitions and allowed indirecttransitions are observed. The composition of films is checkedusing energy dispersive X-ray (EDX) spectroscopy technique. X-raydiffraction (XRD) measurements showed that the CdI2 filmsevaporated at room temperature substrates were characterized by a polycrystalline form. At large thicknesses the films indicated the inhomogeneity. The effect of annealing temperature (up to 523 K) onthe film properties has been studied.

Keywords

Type
Research Article
Information
The European Physical Journal - Applied Physics , Volume 11 , Issue 3 , September 2000 , pp. 159 - 166
Copyright
© EDP Sciences, 2000

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