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A multi-ion beam microanalysis approach for the characterization of plasma polymerized allylamine films

Published online by Cambridge University Press:  28 October 2011

E. Punzón-Quijorna ,
V. Torres-Costa ,
A. Climent-Font  and
M. Manso-Silván
E. Punzón-Quijorna
Affiliation:
Departamento de Física Aplicada, Universidad Autónoma de Madrid, 28049 Madrid, Spain Centro de Microanálisis de Materiales CMAM, Universidad Autónoma de Madrid, 28049 Madrid, Spain
V. Torres-Costa
Affiliation:
Departamento de Física Aplicada, Universidad Autónoma de Madrid, 28049 Madrid, Spain
A. Climent-Font
Affiliation:
Departamento de Física Aplicada, Universidad Autónoma de Madrid, 28049 Madrid, Spain Centro de Microanálisis de Materiales CMAM, Universidad Autónoma de Madrid, 28049 Madrid, Spain
M. Manso-Silván*
Affiliation:
Departamento de Física Aplicada, Universidad Autónoma de Madrid, 28049 Madrid, Spain
*
ae-mail: [email protected]

Abstract

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A full characterization of plasma polymerized biofunctional films requires the use of multi-analytical approaches to determine the chemical composition, topography and potential interaction mechanisms of such films with biomolecules and cells. In this work we aim at underlining the versatility of ion-based techniques to contribute to the chemical characterization of plasma polymerized surfaces. The simultaneous use of energy recoil detection (ERD) and Rutherford backscattering (RBS) spectroscopies with incident He ions is an example of this versatility. Performing sequential measurements and the use of correlating computing tools for ERD-RBS interpretation allows providing in-depth concentration profiles of light elements, including namely hydrogen. More accurate analysis of light elements in polymer films can be increased by looking for particular ions with resonant backscattering responses (i.e., non-Rutherford Scattering). In particular, proton beams of 1.765 MeV are used to increase the detection of C and N, and particular incidence and detector angles to diminish the Si substrate contribution. These analytical tools have been applied to allylamine films and multi-layers crosslinked in a capacitive plasma onto both Si and porous Si substrates.

Type
Research Article
Information
The European Physical Journal - Applied Physics , Volume 56 , Issue 2: Topical Issue: 18th International Colloquium on Plasma Processes (CIP 2011) , November 2011 , 24021
Copyright
© EDP Sciences, 2011

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