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Published online by Cambridge University Press: 15 July 2004
The long-term diffusion processes of defects in HgxCd$_{1-x}$Te mixed
crystals were investigated. Measurements of reflectivity and surface
characterisation by
means of scanning electron microscopy (SEM) were performed for samples with
x = 0.4 and x = 0.62. The experiments were repeated after wet chemical
etching. Optical results were compared with the reflectivity spectra obtained
20 years ago using the same samples of investigated material.
We discuss the observed large changes in the optical spectra on the basis
of comparative analysis and SEM results.