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Enhancing soft X-ray emission with depleted uranium in neon plasma focus

Published online by Cambridge University Press:  17 September 2009

H. U. Khan ,
M. Shafiq ,
S. S. Hussain  and
M. Zakaullah
H. U. Khan
Affiliation:
Department of Physics, Quaid-i-Azam University, 45320 Islamabad, Pakistan
M. Shafiq
Affiliation:
Department of Physics, Quaid-i-Azam University, 45320 Islamabad, Pakistan
S. S. Hussain
Affiliation:
Department of Physics, Quaid-i-Azam University, 45320 Islamabad, Pakistan
M. Zakaullah*
Affiliation:
Department of Physics, Quaid-i-Azam University, 45320 Islamabad, Pakistan
*
[email protected]
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Abstract

Depleted uranium (U $^{238})$ is used for pre-ionization in the neon gas to study the soft X-ray emission in a Mather type plasma focus of 3.3 kJ. The X-rays are detected using an assembly of Quantrad Si pin diodes, masked with differential Ross fitters, and with a multi pinhole camera. The X-ray yield and pinhole images are found strongly influenced by the preionization and the pressure of the working gas. The soft X-ray yield of 82.5 ± 4.0 J in 1.3–1.56 keV energy window is obtained in the case of preionization of neon gas at the optimum pressure of 5 mbar, leading to the conversion efficiency of 2.5% of the stored energy. The total yield with preionization is 195 ± 9.0 J in 4π geometry measured at the optimum pressure of 5 mbar giving conversion efficiency of 5.9%. The time integrated images indicate the broadening of X-ray emission zone with preionization.

Keywords

Type
Research Article
Information
The European Physical Journal - Applied Physics , Volume 48 , Issue 2 , November 2009 , 21001
Copyright
© EDP Sciences, 2009

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