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CCD or CMOS camera noise characterisation

Published online by Cambridge University Press:  29 November 2002

Y. Reibel ,
M. Jung ,
M. Bouhifd ,
B. Cunin  and
C. Draman
Y. Reibel*
Affiliation:
Groupe d'Optique Appliquée, Laboratoire Phase, 23 rue du Loess, 67200 Strasbourg, France
M. Jung
Affiliation:
Groupe d'Optique Appliquée, Laboratoire Phase, 23 rue du Loess, 67200 Strasbourg, France
M. Bouhifd
Affiliation:
Groupe d'Optique Appliquée, Laboratoire Phase, 23 rue du Loess, 67200 Strasbourg, France
B. Cunin
Affiliation:
Groupe d'Optique Appliquée, Laboratoire Phase, 23 rue du Loess, 67200 Strasbourg, France
C. Draman
Affiliation:
Laboratoire des Sciences de l'Image, de l'Information et de la Télédétection, École Nationale Supérieure de Physique, Bd. Sébastien Brand, 67400 Illkirch, France
*
[email protected][email protected]
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Abstract

To achieve optimum imaging performance, any camera system has to be thoroughly checked before being used, particular care being given in evaluating the different contributions due to noise. Our work presents a method for characterising the different sources of noise affecting CCD or CMOS cameras, emphasising the too often overlooked pattern noise. This method is an extended and theoretical approach of the well-known photon transfer technique [1]. Experimentation on our high speed CCD imager illustrates this approach.

Keywords

Type
Research Article
Information
The European Physical Journal - Applied Physics , Volume 21 , Issue 1 , January 2003 , pp. 75 - 80
Copyright
© EDP Sciences, 2003

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