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Improvement of near-field fluorescence imaging of bulk materials by metalcoating*

Published online by Cambridge University Press:  15 May 1999

D. Pastré  and
M. Troyon
D. Pastré
Affiliation:
Université de Reims, Unité de Thermique et Analyse Physique, EA 2061, 21 rue Clément Ader, 51685 Reims Cedex 2, France
M. Troyon*
Affiliation:
Université de Reims, Unité de Thermique et Analyse Physique, EA 2061, 21 rue Clément Ader, 51685 Reims Cedex 2, France
*
[email protected]
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Abstract

By using a simple model based on a linear susceptibility approach and taking into account the dynamic nature of the molecule's electronic structure, the electric fielddiffracted by the near-field probe is evaluated in the presence or absence of a thinsilver layer deposited on the surface of a bulk fluorescent material. This modelingpoints out that the far-field signal emitted by the molecules situated far from thetip is important in the absence of metal coating and can reduce the near-fielddetection sensitivity. It shows that surface metal coating enhances the near-fieldcontribution and decreases the far-field one. Cathodoluminescence images obtained on afluorite (CaF2:Eu) sample confirm the results predicted by modeling.

Keywords

Type
Research Article
Information
The European Physical Journal - Applied Physics , Volume 6 , Issue 2 , May 1999 , pp. 179 - 188
Copyright
© EDP Sciences, 1999

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Footnotes

*

This paper was presented at the special Colloquium CFMCP held atStrasbourg-Illkirch the July 1st-3rd, 1998.

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