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High resolution microscopy techniques for the analysis of biological samples: a comparison

Published online by Cambridge University Press:  07 April 2004

M. Milani ,
M. Ballerini ,
D. Batani ,
F. Squadrini ,
F. Cotelli ,
C. Lora Lamia Donin ,
G. Poletti ,
A. Pozzi ,
K. Eidmann  and
A. Stead
...Show all authors
M. Milani*
Affiliation:
Dipartimento di Scienza dei Materiali and INFM, Università di Milano-Bicocca, Via Cozzi 53, 20126 Milano, Italy
M. Ballerini
Affiliation:
Dipartimento di Scienza dei Materiali and INFM, Università di Milano-Bicocca, Via Cozzi 53, 20126 Milano, Italy
D. Batani
Affiliation:
Dipartimento di Fisica “G. Occhialini” and INFM, Università di Milano-Bicocca, Piazza della Scienza 3, 20126 Milano, Italy
F. Squadrini
Affiliation:
Institute of Infectious and Tropical Diseases, University of Modena, Italy
F. Cotelli
Affiliation:
Università di Milano, Milano, Italy
C. Lora Lamia Donin
Affiliation:
Università di Milano, Milano, Italy
G. Poletti
Affiliation:
Università di Milano, Milano, Italy
A. Pozzi
Affiliation:
Università di Milano, Milano, Italy
K. Eidmann
Affiliation:
MPQ, Max Planck Institute für Quantenoptik, Garching, Germany
A. Stead
Affiliation:
Royal Hallway College, University of London, UK
G. Lucchini
Affiliation:
Dipartimento di Fisica “G. Occhialini” and INFM, Università di Milano-Bicocca, Piazza della Scienza 3, 20126 Milano, Italy
*
[email protected]
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Abstract

Performances and advantages of different high-resolution microscopy techniques are compared. These include Soft X-ray Contact Microscopy (SXCM), Atomic Force Microscopy (AFM), Focused Ion Beam (FIB) and Transmission Electron Microscopy (TEM). It is shown that they allow complementary approaches to imaging of biological objects. These techniques have been used to image the same type of cells (Saccharomyces cerevisiae) thus providing a common benchmark. In particular it is shown that the novel FIB technique allows easy target cell selection, fast operation, high resolution, 3D imaging and sample manipulation during imaging.

Keywords

Type
Research Article
Information
The European Physical Journal - Applied Physics , Volume 26 , Issue 2 , May 2004 , pp. 123 - 131
Copyright
© EDP Sciences, 2004

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References

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