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A Tandem Mass-Spectrometric Method of Cosmogenic Isotope Analysis

Published online by Cambridge University Press:  18 July 2016

A. K. Pavlov
Affiliation:
A. F. Ioffe Physico-Technical Institute, Academy of Sciences, Polytechnicheskaya 26 St. Petersburg 194021 Russia
V. T. Kogan
Affiliation:
A. F. Ioffe Physico-Technical Institute, Academy of Sciences, Polytechnicheskaya 26 St. Petersburg 194021 Russia
G. Y. Gladkov
Affiliation:
A. F. Ioffe Physico-Technical Institute, Academy of Sciences, Polytechnicheskaya 26 St. Petersburg 194021 Russia
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Abstract

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We propose an original method for analysis of low-concentrations of stable and long-lived radioactive nuclides. We discuss the parameters of the main features of the “Trace” spectrometer (a multicharged-ion laser source, a highly sensitive time-of-flight mass spectrometer, a charge-exchange chamber and a mass spectrometer for positive and negative single-charged ion analysis). We also compare these features with conventional AMS devices.

Type
Articles
Copyright
Copyright © The American Journal of Science 

References

Berkovits, D., Boaretto, E., Hollos, G. Kutschera, W. Naaman, R., Paul, M. and Vager, Z. 1990 Study of laser interaction with negative ions. In Yiou, F. and Raisbeck, G. M., eds., Proceedings of the 5th International Conference on Accelerator Mass Spectrometry. Nuclear Instruments and Methods B52: 384–383.Google Scholar
Kocharov, G., Kogan, V., Konstantinov, A. and Pavlov, A. 1990 The possibilities of cosmogenic isotopes investigation by means of mass-spectrometrical methods. In Yiou, F. and Raisbeck, G. M., eds., Proceedings of the 5th International Conference on Accelerator Mass Spectrometry. Nuclear Instruments and Methods B52: 384386.Google Scholar
Shima, K. Mikumo, T. and Tawara, H. 1986 Atomic Data and Nuclear Data Tables 34: 57.Google Scholar
Smikk, D. V. and Dubensky, B. 1984 Mirror of mass-reflectron. Journal of Technical Physics 54: 912916 (in Russian).Google Scholar