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Intra-Pixel Sensitivity Variation and Charge Transfer Inefficiency — Results of CCD Scans

Published online by Cambridge University Press:  05 March 2013

Hiroyuki Toyozumi
Affiliation:
Department of Astrophysics and Optics, University of New South Wales, Sydney NSW 2052, Australia
Michael C. B. Ashley*
Affiliation:
Department of Astrophysics and Optics, University of New South Wales, Sydney NSW 2052, Australia
*
BCorresponding author. Email: [email protected]
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Abstract

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The efficiency with which a charge-coupled device (CCD) detects photons depends, amongst other factors, on where within a pixel the photon hits. To explore this effect we have made detailed scans across a pixel for a front-illuminated three-phase EEV05-20 CCD using the standard astronomical B, V, R, and I colour filters. Pixel response functions and photometric sensitivity maps are derived from the scan images. Nonlinear charge transfer inefficiency (CTI) effects were observed and corrected for. The resulting images clearly show the intra-pixel sensitivity variations (IPSVs) due to the CCD electrode structure, and its dependence on wavelength. We briefly comment on the implications of IPSVs and CTI for high-precision photometry and astrometry.

Type
Research Article
Copyright
Copyright © Astronomical Society of Australia 2005

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