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X-ray cross-correlation analysis of the low-mass X-ray binary 4U 1636-53

Published online by Cambridge University Press:  01 July 2015

Ya-Juan Lei
Ya-Juan Lei*
Affiliation:
Key Laboratory of Optical Astronomy, National Astronomical Observatories, Chinese Academy of Sciences, Beijing 100012, China email: [email protected]
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Abstract

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We analyze the cross-correlation function of the soft and hard X-rays of the atoll source 4U 1636-53 with RXTE data. The results show that the cross-correlations evolve along the different branches of the color-color diagram. At the lower left banana states, we have both positive and ambiguous correlations, and positive correlations are dominant for the lower banana and the upper banana states. The anti-correlation is detected at the top of the upper banana states. The cross-correlations of two atoll sources 4U 1735-44 and 4U 1608-52 have been studied in previous work, and the anti-correlations are detected at the lower left banana or the top of the upper banana states. Our results show that, in the 4U 1636-53, the distribution of the cross-correlations in the color-color diagram is similar to those of 4U 1735-44 and 4U 1608-52, and confirm further that the distribution of cross-correlations in color-color diagram could be correlated with the luminosity of the source.

Keywords

X-rays: binaryaccretion
Type
Contributed Papers
Information
Proceedings of the International Astronomical Union , Volume 10 , Symposium S306: Statistical Challenges in 21st Century Cosmology , May 2014 , pp. 397 - 399
Copyright
Copyright © International Astronomical Union 2015 

References

Hasinger, G. & van der Klis, M. 1989, A&A, 225, 79Google Scholar
Lei, Y. J., Qu, J. L., Song, L. M., et al. 2008, ApJ, 677, 461CrossRefGoogle Scholar
Lei, Y.-J., Zhang, H.-T., Zhang, C.-M., et al. 2013, AJ, 146, 60Google Scholar
Lei, Y.-J., Zhang, S., Qu, J.-L., et al. 2014, AJ, 147, 67CrossRefGoogle Scholar
Sriram, K., Choi, C. S., & Rao, A. R. 2012, ApJS, 200, 16CrossRefGoogle Scholar
van der Klis, M. 2000, ARAA, 38, 717Google Scholar
van Paradijs, J., van der Klis, M., van merongen, S., et al. 1990, A&A, 234, 181Google Scholar
Wang, Y. N., Lei, Y. J., Ding, G. Q., et al. 2014, MNRAS, 440, 3726Google Scholar