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The Impact of Transiting Planet Science on the Next Generation of Direct-Imaging Planet Searches

Published online by Cambridge University Press:  01 May 2008

Joseph C. Carson*
Affiliation:
Max-Planck-Institut für Astronomie, Königstuhl 17, 69115 Heidelberg, Germany email: [email protected]
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Abstract

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Within the next five years, a number of direct-imaging planet search instruments, like the VLT SPHERE instrument, will be coming online. To successfully carry out their programs, these instruments will rely heavily on a-priori information on planet composition, atmosphere, and evolution. Transiting planet surveys, while covering a different semi-major axis regime, have the potential to provide critical foundations for these next-generation surveys. For example, improved information on planetary evolutionary tracks may significantly impact the insights that can be drawn from direct-imaging statistical data. Other high-impact results from transiting planet science include information on mass-to-radius relationships as well as atmospheric absorption bands. The marriage of transiting planet and direct-imaging results may eventually give us the first complete picture of planet migration, multiplicity, and general evolution.

Type
Contributed Papers
Copyright
Copyright © International Astronomical Union 2009

References

Bakos, G., Noyes, R. W., Kovacs, G., Stanek, K. Z., Sasselov, D. D., & Domsa, I. 2004, PASP, 116, 266CrossRefGoogle Scholar
Baraffe, I., Chabrier, G., Barman, T. S., Allard, F., & Hauschildt, P. H. 2003, A&A, 402, 701Google Scholar
Beuzit, J.-L. et al. 2008, SPIE, in pressGoogle Scholar
Hinkley, S., Oppenheimer, B. R., Brenner, D., Parry, I. R., Sivaramakrishnan, A., Soummer, R., & King, D. 2008, SPIE, in pressGoogle Scholar
Macintosh, B. et al. 2006, SPIE, 6272, 18Google Scholar
Tamura, Motohide et al. 2006, SPIE, 6269, 28Google Scholar