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EUV continuum of narrow-line Seyfert 1 galaxies

Published online by Cambridge University Press:  24 November 2004

M. Dietrich ,
D. M. Crenshaw  and
S. B. Kraemer
M. Dietrich
Affiliation:
Georgia State University, Department of Physics & Astronomy, Atlanta, GA 30303, USA email: [email protected], [email protected]
D. M. Crenshaw
Affiliation:
Georgia State University, Department of Physics & Astronomy, Atlanta, GA 30303, USA email: [email protected], [email protected]
S. B. Kraemer
Affiliation:
Catholic University of America, NASA/Goddard Space Flight Center, Code 681, Greenbelt, MD 20771, USA email: [email protected]
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Abstract

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We study the NLR emission line spectrum of 12 NLS1s to constrain the EUV – soft X-ray continuum SED using accurate photoionization modeling. We find that the NLR emission line ratios, which we measure for several NLS1 galaxies, can be reproduced within ±15% without a strong BBB component in the framework of a two-component model.To search for other articles by the author(s) go to: http://adsabs.harvard.edu/abstract_service.html

Type
POSTERS
Information
Proceedings of the International Astronomical Union , Volume 2004 , Issue IAUS222 , March 2004 , pp. 87 - 88
Copyright
© 2004 International Astronomical Union