Hostname: page-component-cd9895bd7-jn8rn Total loading time: 0 Render date: 2024-12-26T14:25:18.786Z Has data issue: false hasContentIssue false
  • English
  • Français

XRPD and Rietveld refinement for Al5NdNi2 compound

Published online by Cambridge University Press:  04 April 2018

Degui Li ,
Kun Luo ,
Bing He ,
Liuqing Liang ,
Ming Qin  and
Tian Lu
Degui Li*
Affiliation:
College of Materials Science and Engineering, Guilin University of Technology, Guilin, Guangxi 541004, China School of Materials Science and Engineering, Baise University, Baise, Guangxi 533000, China
Kun Luo
Affiliation:
College of Materials Science and Engineering, Guilin University of Technology, Guilin, Guangxi 541004, China
Bing He
Affiliation:
School of Materials Science and Engineering, Baise University, Baise, Guangxi 533000, China
Liuqing Liang
Affiliation:
School of Materials Science and Engineering, Baise University, Baise, Guangxi 533000, China
Ming Qin
Affiliation:
School of Materials Science and Engineering, Baise University, Baise, Guangxi 533000, China
Tian Lu
Affiliation:
College of Materials Science and Engineering, Guilin University of Technology, Guilin, Guangxi 541004, China
*
a)Author to whom correspondence should be addressed. Electronic mail: [email protected]
Get access Rights & Permissions [Opens in a new window]

Abstract

A new ternary compound Al5NdNi2 was prepared by melting a stoichiometric mixture of aluminum, neodymium, and nickel in an arc furnace and annealing in vacuum. The crystal structure of Al5NdNi2 was studied by X-ray powder diffraction technique and Rietveld analysis. All diffraction lines of Al5NdNi2 were indexed, and the lattice parameters were refined with an orthorhombic structure type of space group Immm (No.71) using Rietveld analysis program DBWS-9807. The lattice parameters are presented, a = 7.0508(1) Å, b = 9.5690(1) Å, c = 3.9792(1) Å, V = 268.47 Å3, Z = 2, ρ = 4.91 g cm−3, and RIR = 1.23.

Keywords

Al5NdNi2X-ray powder diffractionRietveld refinement
Type
New Diffraction Data
Information
Powder Diffraction , Volume 33 , Issue 2 , June 2018 , pp. 172 - 175
Check for updates
Copyright
Copyright © International Centre for Diffraction Data 2018 

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

Cline, J. P., Von Dreele, R. B., Winburn, R., Stephens, P. W., and Filliben, J. J. (2011). “Addressing the amorphous content issue in quantitative phase analysis: the certification of NIST SRM 676a,” Acta Crystallogr. A A67, 357–367.CrossRefGoogle Scholar
Inorganic Crystal Structure Database (2015). Fachinformationszentrum (U.S. Department of Commerce on the behalf of the United States, Karlsruhe, Germany).Google Scholar
Isikawa, Y., Mizushima, T., Sakurai, J., Mori, K., Munoz, A., Givord, F., Boucherle, J. X., Voiron, J., Oliveira, I. S., and Flouquet, J. (1994). “Magnetic properties and neutron diffraction measurements of dense-Kondo compound CeNi2Al5,” J. Phys. Soc. Jpn. 63(6), 2349–2358.CrossRefGoogle Scholar
Materials Data Inc. (2002). JADE Version 6.5 XRD Pattern Processing (Materials Data Inc., Livermore, CA).Google Scholar
Schreiner, W. N. (1995). “A standard test method for the determination of RIR values by x-ray diffraction, ” Powder Diffr. 10, 25–33.CrossRefGoogle Scholar
Smith, G. S. and Snyder, R. L. (1979). “FN: a criterion for rating powder diffraction patterns and evaluating the reliability of powder-pattern indexing,” J. Appl. Crystallogr. 12, 60–65.CrossRefGoogle Scholar
Young, R. A., Larson, A. C., and Paiva-Santos, C. O. (2000). User's Guide to Program DBWS-9807a for Rietveld Analysis of X-ray and Neutron Powder Diffraction Patterns with a PC and Various other Computers (School of Physics, Georgia Institute of Technology, Atlanta, GA).Google Scholar
Supplementary material: File

Li et al. supplementary material 1

Li et al. supplementary material

Download Li et al. supplementary material 1(File)
File 47.6 KB