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X-ray powder diffraction study of Sn0.59Ti0.41Te3O8

Published online by Cambridge University Press:  29 February 2012

W. Ben Aribia ,
M. Loukil ,
A. Kabadou  and
A. Ben Salah
W. Ben Aribia
Affiliation:
Laboratoire des Sciences des Matériaux et d’Environnement, Faculté des Sciences de Sfax, B.P. 802, 3018 Sfax, Tunisie
M. Loukil
Affiliation:
Laboratoire des Sciences des Matériaux et d’Environnement, Faculté des Sciences de Sfax, B.P. 802, 3018 Sfax, Tunisie
A. Kabadou
Affiliation:
Laboratoire des Sciences des Matériaux et d’Environnement, Faculté des Sciences de Sfax, B.P. 802, 3018 Sfax, Tunisie
A. Ben Salah
Affiliation:
Laboratoire des Sciences des Matériaux et d’Environnement, Faculté des Sciences de Sfax, B.P. 802, 3018 Sfax, Tunisie
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Abstract

The crystal structure of titanium-tin tellurium oxide Sn0.59Ti0.41Te3O8 has been determined using X-ray powder diffraction techniques. At room temperature, the title compound crystallizes in cubic space group Ia-3, with lattice parameter a=11.05515(6) Å. Rietveld refinement of the structure led to final confidence factors Rp=0.0395 and Rwp=0.0577. The structure of Sn0.59Ti0.41Te3O8 consists of isolated Ti/SnO6-octahedra slightly deformed in the a direction. The TeO4E [E=lone pair of Te(IV) atoms] groups are located between the octahedra ensuring the stability of the structure by Ti/Sn-O-Te bonding contacts. Only one peak in thermal behavior was detected for this compound at 488 K by differential scanning calorimetry experiment. An IR spectroscopic study is employed as a means to obtain preliminary structural information and shows the presence of the Ti/SnO6 and TeO4E groups. This result is later confirmed by X-ray diffraction studies.

Keywords

DSCrietveld refinementtellurium oxideIR spectroscopy
Type
TECHNICAL ARTICLES
Information
Powder Diffraction , Volume 23 , Issue 3 , September 2008 , pp. 228 - 231
Copyright
Copyright © Cambridge University Press 2008

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