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X-ray powder diffraction data for δ-Na2Si2O5

Published online by Cambridge University Press:  10 January 2013

V. Kahlenberg ,
M. Wendschuh-Josties ,
R. X. Fischer ,
H. Bauer ,
J. Holz ,
G. Schimmel  and
A. Tapper
V. Kahlenberg
Affiliation:
FB Geowissenschaften (Kristallographie), Universität Bremen, Klagenfurter Str., D-28359 Bremen, Germany
M. Wendschuh-Josties
Affiliation:
FB Geowissenschaften (Kristallographie), Universität Bremen, Klagenfurter Str., D-28359 Bremen, Germany
R. X. Fischer
Affiliation:
FB Geowissenschaften (Kristallographie), Universität Bremen, Klagenfurter Str., D-28359 Bremen, Germany
H. Bauer
Affiliation:
Clariant GmbH, Hürth-Knapsack, Germany
J. Holz
Affiliation:
Clariant GmbH, Hürth-Knapsack, Germany
G. Schimmel
Affiliation:
Clariant GmbH, Hürth-Knapsack, Germany
A. Tapper
Affiliation:
Clariant GmbH, Hürth-Knapsack, Germany
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Abstract

The X-ray powder diffraction data for δ-Na2Si2O5 are reported. The sample was prepared from water glass solution applied to pressed powder tablets of finely ground quartz using a heating program with a maximal temperature of 700 °C. The crystallographic data for δ-disilicate obtained from a Rietveld analysis are: space group P21/n, a=8.3818(4) Å, b=12.0726(5) Å, c=4.8455(2) Å, β=90.303(5)°, V=490.31 Å3, Z=4, and Dcalc.=2.468 g/cm3.

Type
New Diffraction Data
Information
Powder Diffraction , Volume 15 , Issue 2 , June 2000 , pp. 139 - 141
Copyright
Copyright © Cambridge University Press 2000

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