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X-ray powder diffraction and dielectric study of BaTi1−x(Zn1/3Nb2/3)xO3 (x=0.025 and 0.9)

Published online by Cambridge University Press:  29 February 2012

L. Khemakhem ,
A. Kabadou ,
A. Ben Salah  and
N. Abdelmoula
L. Khemakhem
Affiliation:
Laboratoire des Sciences des Matériaux et d’Environnement and Laboratoire des Matériaux Ferroélectriques, Faculté des Sciences de Sfax, B.P. 802, 3018 Sfax, Tunisie
A. Kabadou
Affiliation:
Laboratoire des Sciences des Matériaux et d’Environnement, Faculté des Sciences de Sfax, B.P. 802, 3018 Sfax, Tunisie
A. Ben Salah
Affiliation:
Laboratoire des Sciences des Matériaux et d’Environnement, Faculté des Sciences de Sfax, B.P. 802, 3018 Sfax, Tunisie
N. Abdelmoula
Affiliation:
Laboratoire des Matériaux Ferroélectriques, Faculté des Sciences de Sfax, B.P. 802, 3018 Sfax, Tunisie
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Abstract

Polycrystalline BaTi1−x(Zn1/3Nb2/3)xO3 (x=0.025 and 0.9) compounds were synthesized successfully and studied by XRD and dielectric measurements. The effects of the Ti/(Zn,Nb) ratio on the structure and dielectric properties of the compounds were investigated. XRD results indicated that the crystal structure of the x=0.09 compound is cubic perovskite with space group Pm3m and a=4.0095(4) Å. For the x=0.09 compound, a splitting of the (200) peak was observed near 40.2°, indicating that the crystal structure changed from cubic to tetragonal, with space group P4mm, a=4.026(4) Å, and c=4.0091(4) Å. Rietveld refinement of the crystal structures led to final confidence factors Rp=0.0353 and Rp=0.0349 for x=0.025 and 0.9, respectively. Dielectric measurements showed a relaxor behavior present in BaTi0.1(Zn1/3Nb2/3)0.9.

Keywords

ceramicRietveld refinementXRDdielectric measurement
Type
TECHNICAL ARTICLES
Information
Powder Diffraction , Volume 23 , Issue 3 , September 2008 , pp. 241 - 245
Copyright
Copyright © Cambridge University Press 2008

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