Hostname: page-component-78c5997874-j824f Total loading time: 0 Render date: 2024-11-14T19:17:19.092Z Has data issue: false hasContentIssue false
  • English
  • Français

X-ray diffraction characterization of the microstructure of close-packed hexagonal nanomaterials

Published online by Cambridge University Press:  29 February 2012

Zhao-hui Pu ,
Chuan-zheng Yang ,
Pei Qin ,
Yu-wan Lou  and
Li-fang Cheng
Zhao-hui Pu
Affiliation:
Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Shanghai 200050, China
Chuan-zheng Yang
Affiliation:
Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Shanghai 200050, China
Pei Qin
Affiliation:
Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Shanghai 200050, China
Yu-wan Lou
Affiliation:
Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Shanghai 200050, China
Li-fang Cheng
Affiliation:
National Engineering and Research Center for Nanotechnology, Shanghai 200237, China
Get access Rights & Permissions [Opens in a new window]

Abstract

A general least-squares technique for X-ray diffraction line broadening analysis has been developed. The technique can be used to determine single, double, and triple line broadening effects caused by small particle sizes, microstrain, stacking faults, or all three presented in a closed-packed hexagonal nanomaterial. The technique was applied to characterize the microstructure of β-Ni(OH)2, a negative electrode material in nickel-metal hydride (NiMH) batteries. Double line broadening effects caused by both small crystallite sizes and stacking faults in β-Ni(OH)2 were detected and analyzed. Triple line broadening effects caused simultaneously by small crystallite sizes, microstrain, and stacking faults were detected in β-Ni(OH)2 after activation and charge-discharge cycle tests. The triple line broadening effects were found to be selective and most pronounced for diffraction lines with h−k=3n±1. The broadening effects were larger when l=even, but smaller when l=odd. The shape and the average size of the crystallites, microstrain, and stacking fault probability in β-Ni(OH)2 changed dramatically after activation and charge-discharge cycles. The method was also applied to characterize and investigate the microstructure of nano ZnO materials. Results indicate that no selective broadening appears in the XRD patterns of the nano ZnO materials. The average crystallite sizes were different slightly, and the stacking fault probabilities differed significantly with different dopants.

Keywords

nanomaterialsβ-Ni(OH)2ZnOX-ray line broadening effects
Type
TECHNICAL ARTICLES
Information
Powder Diffraction , Volume 23 , Issue 3 , September 2008 , pp. 213 - 223
Copyright
Copyright © Cambridge University Press 2008

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

Cheng, G.-F., Yang, C.-Z., and Huang, Y.-H. (2008). “Characterization and research of hexagonal closed packing structured ZnO nano-powder by X-ray diffraction method,” Int. J. Inorg. Mater. IJIMCR 23, 199–202.CrossRefGoogle Scholar
Klug, H. P. and Alexander, L. E. (1974). X-ray Diffraction Procedures for Polycrystalline and Amorphous Materials, 2nd ed. (Wiley, New York), p. 618.Google Scholar
Langford, J. I., Boultif, A., Auffrédic, J. P., and Louër, D. (1993). “The use of pattern decomposition to study the combined X-ray diffraction effects of crystallite size and stacking faults in ex-oxalate zinc oxide,” J. Appl. Crystallogr. JACGAR 10.1107/S0021889892007684 26, 22–23.CrossRefGoogle Scholar
Lou, Y.-W., Yang, C.-Z., Zhang, X.-G., Ma, L.-P., and Xia, B.-J. (2006). “Comparative study on microstructure of β-Ni(OH)2 as cathode material for Ni-MH battery,” Sci. China, Ser. E: Technol. Sci. SCETFO 49, 297–312.CrossRefGoogle Scholar
Qin, P., Lou, Yu.-W., Yang, C.-Z., and Xia, B.-J. (2006). “New computing methods and programs for separating multiple-broadening effects of X-ray diffraction lines,” Acta Phys. Sin. WLHPAR 55, 1325–1335.CrossRefGoogle Scholar
Wang, Y.-H. (1987). Elements of X-ray Diffraction Technology (Press of Atomic Energy, Beijing), p. 258.Google Scholar
Warren, B. E. (1969). X-Ray Diffraction (Addison-Wesley, London), pp. 298–305.Google Scholar