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TMS 2020 Annual Meeting & Exhibition Report

Published online by Cambridge University Press:  17 September 2020

Fan Zhang*
Affiliation:
Materials Measurement Science Division, National Institute of Standards and Technology, Gaithersburg, MD20899, USA
*
a)Author to whom correspondence should be addressed. Electronic mail: [email protected]

Abstract

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Type
International Report
Copyright
Copyright © 2020 International Centre for Diffraction Data

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References

Bohnert, A.-A. (2020). “A mark of excellence: The 2020 TMS award recipients,” JOM 72(2), 585600.Google Scholar