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Structural and thermoelectric properties of Pb4In2.6Bi3.4Se13

Published online by Cambridge University Press:  02 July 2021

W. Wong-Ng*
Affiliation:
Materials Measurement Science Division, National Institute of Standards and Technology, Gaithersburg, Maryland20899, USA
J. Guo
Affiliation:
State Key Laboratory of Advanced Technology for Materials Synthesis and Processing, Wuhan University of Technology, Wuhan, Hubei430070, China
Y. Yan
Affiliation:
State Key Laboratory of Advanced Technology for Materials Synthesis and Processing, Wuhan University of Technology, Wuhan, Hubei430070, China
J. A. Kaduk
Affiliation:
Department of Biological and Chemical Sciences, Illinois Institute of Technology, Chicago, Illinois60616, USA
*
a)Author to whom correspondence should be addressed. Electronic mail: [email protected]

Abstract

Quaternary selenide, Pb4In2.6Bi3.4Se13 (x = 2.4 member of the Pb4(InxBi6-xSe13 solid solution), was synthesized by a solid-state technique, and its structure was determined using powder X-ray diffraction (XRD). Pb4In2.6Bi3.4Se13 crystallizes in the orthorhombic space group Pbam (No. 55) with Z = 4. Lattice parameters and calculated density were determined to be a = 22.152(5) Å, b = 27.454(5) Å, and c = 4.1354(6) Å, V = 2515.0(11) Å3, and Dx = 7.490 g cm3. The structure consists of Z-shaped ribbon units and corner-shared infinite one-dimensional [InSe4] chains running parallel to the c-axis. The chains and ribbons are further connected by Pb atoms to form a three-dimensional network. Pb atoms are situated in the center of bicapped trigonal prisms. The compound exhibits a semiconductor feature. The Seebeck coefficient of Pb4In2.6Bi3.4Se13 was found to be −180 μV K−1 at 295 K and −380 μV K−1 at 600 K. Combining the values of Seebeck coefficient, electrical conductivity, and thermal conductivity yield a figure of merit, ZT, of about 0.175 at 700 K. The powder XRD pattern of Pb4In2.6Bi3.4Se13 was also determined.

Type
Technical Article
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of International Centre for Diffraction Data

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