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Simultaneous Determination of Layer Thickness, Composition, and Mass Absorption by X-Ray Diffraction

Published online by Cambridge University Press:  10 January 2013

Stefano Battaglia ,
Marco Franzini  and
Leonardo Leoni
Stefano Battaglia
Affiliation:
Institute of Geothermal Research C.N.R., Pza Solferino 2, 56126, Pisa, Italy
Marco Franzini
Affiliation:
Department of Earth Sciences, University of Pisa, Via S.Maria 53, 56100, Pisa, Italy
Leonardo Leoni
Affiliation:
Department of Earth Sciences, University of Pisa, Via S.Maria 53, 56100, Pisa, Italy
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Abstract

This paper describes a new method for the simultaneous determination of mineral composition, mass thickness and mass absorption coefficient of a thin layer of a crystalline substance deposited on a crystalline substrate.

The samples were deposited on membrane disc filters, consisting of mixtures of cellulose acetate and cellulose nitrate. Quantitative results are achieved by measuring the diffraction intensity of the analyte and the attenuation of a reflection of the crystalline material supporting the deposited sample. The mean accuracy of the analysis was found to be: ≈ 3% for mass thickness, ≈ 1% for mass absorption coefficient and ≈ 4% for quantitative mineralogical determination.

Type
Research Article
Information
Powder Diffraction , Volume 7 , Issue 4 , December 1992 , pp. 194 - 196
Copyright
Copyright © Cambridge University Press 1992

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