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A Simplified Correction for Surface Roughness Effects in X-Ray Diffractometric Investigations

Published online by Cambridge University Press:  10 January 2013

R. Vasudevan ,
R. Ramesh ,
B. Pathiraj  and
B.H. Kolster
R. Vasudevan
Affiliation:
Department of Metallurgical Engineering, Indian Institute of Technology, Madras 600 036, India
R. Ramesh
Affiliation:
Foundation for Advanced Metals Science (SGM) 7550 KA HENGELO, The Netherlands
B. Pathiraj
Affiliation:
Foundation for Advanced Metals Science (SGM) 7550 KA HENGELO, The Netherlands
B.H. Kolster
Affiliation:
Foundation for Advanced Metals Science (SGM) and Materials Science Section, Faculty of Mechanical Engineering, University of Twente, Enschede, The Netherlands
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Abstract

The importance of surface roughness to the measurement of integrated intensity in X-ray powder diffraction is discussed following studies conducted with materials in both powder and bulk (rolled sheet/billet) forms possessing different absorption characteristics. A simple procedure is described which allows for surface roughness effect.

Type
Research Article
Information
Powder Diffraction , Volume 7 , Issue 2 , June 1992 , pp. 77 - 82
Copyright
Copyright © Cambridge University Press 1992

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