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Rietveld refinement of ternary compound Gd117Fe52Ge112

Published online by Cambridge University Press:  01 March 2012

Wei He
Affiliation:
Key Laboratory of Nonferrous Metal Materials and New Processing Technology, Ministry of Education, Physics Department, Guangxi University, Nanning, Guangxi, 530004, China
Jiliang Zhang
Affiliation:
Key Laboratory of Nonferrous Metal Materials and New Processing Technology, Ministry of Education, Physics Department, Guangxi University, Nanning, Guangxi, 530004, China
Lingmin Zeng
Affiliation:
Key Laboratory of Nonferrous Metal Materials and New Processing Technology, Ministry of Education, Physics Department, Guangxi University, Nanning, Guangxi, 530004, China

Abstract

A new ternary compound Gd117Fe52Ge112 has been successfully synthesized and studied by means of X-ray powder diffraction technique. Gd117Fe52Ge112 crystallizes in a cubic Tb117Fe52Ge112-type structure with space group Fm3m(#225) and lattice parameter a=28.7680(1) Å. Crystal structure of Gd117Fe52Ge112 has been successfully refined using the Rietveld method from X-ray diffraction data. The R-factors for the Rietveld refinement are Rp=0.099 and Rwp=0.128. X-ray powder diffraction data with the figure of merit F30 of 80.4(30) are also reported.

Type
Representative Papers from the Chinese XRD 2006 Conference
Copyright
Copyright © Cambridge University Press 2007

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