Hostname: page-component-cd9895bd7-fscjk Total loading time: 0 Render date: 2025-01-04T10:37:59.519Z Has data issue: false hasContentIssue false
  • English
  • Français

A quantitative X-ray powder diffraction analysis of the Li2O–SiO2 glass–ceramic system

Published online by Cambridge University Press:  10 January 2013

D. W. Tomlin ,
D. B. Sullenger  and
J. S. Cantrell
D. W. Tomlin
Affiliation:
EG&G Mound Applied Technologies, Inc.c), P.O. Box 3000, Miamisburg, Ohio 45343-3000
D. B. Sullenger
Affiliation:
EG&G Mound Applied Technologies, Inc.c), P.O. Box 3000, Miamisburg, Ohio 45343-3000
J. S. Cantrell
Affiliation:
EG&G Mound Applied Technologies, Inc.c), P.O. Box 3000, Miamisburg, Ohio 45343-3000
Get access Rights & Permissions [Opens in a new window]

Abstract

An X-ray powder diffraction quantitative analysis has been developed to determine the relative amounts of the principal crystalline phases (α-Li2SiO3, α-Li2Si2O5 and the α-cristobalite form of SiO2) contained in selected Li2O–SiO2 glass-ceramics. The analysis was extended to estimate the amorphous-to-crystalline content ratio of individual samples. The method utilized is an external-standard intensity ratio technique that employs cristobalite, a component common to each sample, for a standard.

Type
Research Article
Information
Powder Diffraction , Volume 8 , Issue 1 , March 1993 , pp. 29 - 35
Copyright
Copyright © Cambridge University Press 1993

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

Alexander, L., and Klug, H. (1948). Anal. Chem. 20, 886–88.CrossRefGoogle Scholar
Bish, D. L., and Reynolds, R. C. Jr., (1989). “Sample preparation for X-ray diffraction,” in Modern Powder Diffraction, edited by Bish, D. L. and Post, J. E. (Mineralogical Society of America, Washington, DC), pp. 73–99.CrossRefGoogle Scholar
Chung, F. H. (1974). J. Appl. Cryst. 7, 519–525.CrossRefGoogle Scholar
“Excel.” (1988). Version 1.5. Redmond, Washington 98073: Microsoft Corporation.Google Scholar
Goehner, R. P. (1980). “SPECPLOT—An interactive data reduction and display program for spectral data,” in Advances in X-ray Analysis, Vol. XXIII, edited by Rhodes, J. R., Barrett, C. S., Leyden, D. E., Newkirk, J. B., Predecki, P. K., and Ruud, C. O. (Plenum, New York), pp. 305–311.Google Scholar
Goehner, R. P. (1982). Advances in X-ray Analysis, Vol. XXV, edited by Russ, J. C., Barrett, C. S., Predecki, P. K., and Leyden, D. E. (Plenum, New York), pp. 309–313.Google Scholar
Henderson, W. R., Kramer, D. P., and Sullenger, D. B. (1984). Determination of the Optimum Crystallization Conditions of a High Thermal Expansion Glass-Ceramic, Report MLM-3136, Monsanto Research Corporation, Miamisburg, Ohio.CrossRefGoogle Scholar
Pawloski, G. A. (1985). Amer. Miner. 70, 663–667.Google Scholar
Rafferty, J., and Norling, R. (1988). “Cricket Graph—Presentation Graphics for Science and Business,” Version 1.3. Malvern, Pennsylvania 19355: Cricket SoftwareGoogle Scholar
Sullenger, D. B. (1985). Standard Analytical Procedure 383, Manual No. PD-80026, EG&G Mound Applied Technologies, Miamisburg, Ohio.Google Scholar
Tomlin, D. W.. (1991) “X-Ray diffraction characterization of bioactive and glass–ceramic systems,” PhD thesis, Miami University, Oxford, Ohio.Google Scholar
Tomlin, D.W., Sullenger, D. B., and Cantrell, J. S. (1991). Quantitative Powder X-ray Diffraction Analysis of the Li2O-SiO2 Glass-Ceramic System (EG&G Mound Applied Technologies, Miamisburg, Ohio).Google Scholar