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Quantitative phase analysis of natural products using whole-powder-pattern decomposition

Published online by Cambridge University Press:  10 January 2013

Shigeo Hayashi  and
Hideo Toraya
Shigeo Hayashi
Affiliation:
Ceramics Research Laboratory, Nagoya Institute of Technology, Asahigaoka, Tajimi 507-0071, Japan
Hideo Toraya
Affiliation:
Ceramics Research Laboratory, Nagoya Institute of Technology, Asahigaoka, Tajimi 507-0071, Japan
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Abstract

The capability of whole-powder-pattern decomposition in the quantitative phase analysis (QPA) of natural products was investigated using three- to six-component mixtures and pottery bodies. Here, the term pottery body means plastic clay suitable for making pottery and it is compounded of ceramic raw materials. Average errors of the weight fractions for each phase were within 1 weight percent in each mixture of natural products. The amounts of reduced oxides in pottery bodies derived from the X-ray diffraction technique were in good agreement with results obtained by X-ray fluorescence analysis. The present procedure does not require knowledge of crystal structures; it appears adequate for the QPA of natural products.

Keywords

quantitative phase analysisX-ray diffractionwhole-powder-pattern decomposition methodnatural product
Type
Technical Articles
Information
Powder Diffraction , Volume 15 , Issue 2 , June 2000 , pp. 86 - 90
Copyright
Copyright © Cambridge University Press 2000

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References

Alexander, N. W. (1967). Elements of Optical Mineralogy, Part II. Descriptions of Minerals, 4th ed. (Wiley, New York), pp. 303–330.Google Scholar
Hayashi, S., and Toraya, H. (1999). “Accuracy in the quantitative phase analysis of eight- to ten-component ceramic materials using the whole-powder-pattern fitting methods,” J. Ceram. Soc. Jpn. 107, 249–257(in Japanese).CrossRefGoogle Scholar
Hill, R. J., and Howard, C. J. (1987). “Quantitative phase analysis from neutron powder diffraction data using the Rietveld method,” J. Appl. Crystallogr. 20, 467–474.CrossRefGoogle Scholar
Hill, R. J., Tsambourakis, G., and Madsen, I. C. (1993). “Improved petrological modal analysis from X-ray powder diffraction data by use of the Rietveld method I. Selected igneous, volcanic, and metamorphic rocks,” J. Petrol. 34, 867–900.CrossRefGoogle Scholar
Imai, T., Hayashi, S., and Toraya, H. (1998). “Accuracy in the quantitative phase analysis of silicon nitrides,” J. Ceram. Soc. Jpn. 106, 798–807(in Japanese).CrossRefGoogle Scholar
Rietveld, H. M. (1969). “A profile refinement method for nuclear and magnetic structures,” J. Appl. Crystallogr. 2, 65–71.CrossRefGoogle Scholar
Smith, D. K., Johnson, G. G., Scheible, A., Wims, A. M., Johnson, J. L., and Ullmann, G. (1987). “Quantitative X-ray powder diffraction method using the full diffraction pattern,” Powder Diffr. 2, 73–77.CrossRefGoogle Scholar
Smith, D. K., Johnson, G. G., Kelton, M. J., and Anderson, C. A. (1989). “Chemical constraints in quantitative X-ray powder diffraction for mineral analysis of the sand/silt fractions of sedimentary rocks,” Adv. X-Ray Anal. 32, 489–496.Google Scholar
Toraya, H., Yoshimura, M., and Somiya, S. (1984). “Calibration curve for quantitative analysis of the monoclinic-tetragonal ZrO 2 system by X-ray diffraction,” J. Am. Ceram. Soc. 67,C119–C121.CrossRefGoogle Scholar
Toraya, H. (1986). “Whole-powder-pattern fitting without reference to a structural model: Application to X-ray powder data,” J. Appl. Crystallogr. 19, 440–447.CrossRefGoogle Scholar
Toraya, H. (1990). “Array-type universal profile function for powder fitting,” J. Appl. Crystallogr. 23, 485–491.CrossRefGoogle Scholar
Toraya, H., and Tsusaka, S. (1995). “Quantitative phase analysis using the whole-powder-pattern decomposition method I. Solution from knowledge of chemical compositions,” J. Appl. Crystallogr. 28, 392–399.CrossRefGoogle Scholar
Toraya, H. (1999). “Quantitative phase analysis of α- and β-silicon nitrides I. Estimation of errors,” J. Appl. Crystallogr. 32, 704–715.CrossRefGoogle Scholar
Werner, P. E., Salome, S., Malmors, G., and Fiala, J. (1979). “Quantitative analysis of multicomponent powders by full-profile of Guinier-Hagg X-ray film data,” J. Appl. Crystallogr. 12, 107–109.CrossRefGoogle Scholar
Wilson, A. J. C. (1992). International Tables for Crystallography (Kluwer Academic, Dordrecht), Vol. C, pp. 189–206.Google Scholar
Young, R. A. (1995). The Rietveld Method (International Union of Crystallography, Oxford University Press, Oxford), pp. 1–38.Google Scholar