Hostname: page-component-cd9895bd7-jkksz Total loading time: 0 Render date: 2024-12-24T18:55:48.890Z Has data issue: false hasContentIssue false

The new Material Science Powder Diffraction beamline at ALBA Synchrotron

Published online by Cambridge University Press:  14 November 2013

F. Fauth*
Affiliation:
CELLS-ALBA, BP1413, 08290 Cerdanyola del Vallès, Barcelona, Spain
I. Peral
Affiliation:
CELLS-ALBA, BP1413, 08290 Cerdanyola del Vallès, Barcelona, Spain
C. Popescu
Affiliation:
CELLS-ALBA, BP1413, 08290 Cerdanyola del Vallès, Barcelona, Spain
M. Knapp
Affiliation:
CELLS-ALBA, BP1413, 08290 Cerdanyola del Vallès, Barcelona, Spain

Abstract

The current report describes the installation and the preliminary commissioning of the Material Science Powder Diffraction (MSPD) beamline at the Spanish synchrotron ALBA-CELLS. The beamline is fully dedicated to powder diffraction techniques and consists of two experimental stations positioned in series: a High Pressure/Microdiffraction station and a High Resolution/High Throughput powder diffraction station.

Type
Technical Articles
Copyright
Copyright © International Centre for Diffraction Data 2013 

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

Alkire, R. W., Rosenbaum, G. and Evans, G. (2000). Design of a vacuum-compatible high-precision monochromatic beam-position monitor for use with synchrotron radiation from 5 to 25 keV,” J. Synchrotron Radiat. 7, 6168.Google Scholar
Bergamaschi, A., Cervellino, A., Dinapoli, R., Gozzo, F., Henrich, B., Johnson, I., Kraft, P., Mozzanica, A., Schmitt, B. and Shi, X. (2010). “The MYTHEN detector for X-ray powder diffraction experiments at the Swiss Light Source,” J. Synchrotron Radiat. 17, 653668.Google Scholar
Boehler, R. (2006). “New diamond cell for single-crystal x-ray diffraction,” Rev. Sci. Instrum. 77. 115103.CrossRefGoogle Scholar
Fuchs, M. R., Holldack, K., Reichardt, G. and Mueller, U. (2007). “Transmissive Imaging X–Ray Beam Position Monitors (XBPM) for Protein Crystallography (PX) Beamlines,” AIP Conf. Proc. 879, 10061009. [doi: 10.1063/1.2436232].CrossRefGoogle Scholar
Hammersley, A. P., Svensson, S. O., Hanfland, M., Fitch, A. M. and Haussermann, D. (1996). “Two-dimensional detector software: From real detector to idealised image or two-theta scan,” High Pressure Res. 14, 235248.Google Scholar
Klotz, S., Chervin, J.-C., Munsch, P. and Le Marchand (2009). “Hydrostatic limits of 11 pressure transmitting media,” J. Phys. D: Appl. Phys. 42, 075413.CrossRefGoogle Scholar
Larson, A. C. and von Dreele, R. B. (1994). GSAS: General Structure Analysis System (Report LAUR 86-748). Los Alamos, New Mexico: Los Alamos National Laboratory.Google Scholar
Lidon-Simon, J., Fernandez-Carreiras, D., Gigante, J., Jamroz, J., Klora, J. and Matilla, O. (2011). “Low current meausrements at ALBA,” WEPMS025: Proceedings of ICALEPCS2011, Grenoble, France Hardware, 1032-1035.Google Scholar
Mao, H. K., Xu, J. and Bell, P. M. (1986). “Calibration of the ruby pressure gauge to 800 kbar under quasi–hydrostatic conditions,” J. Geophys. Res., [Solid Earth Planets] 91, 46734676.CrossRefGoogle Scholar
Panchal, V., Errandonea, D., Segura, A., Rodriguez-Hernandez, P., Munoz, A., Lopez-Moreno, S. and Betonelli, M. (2011). “The electronic structure of zircon-type orthovanadates: Effects of high-pressure and cation substitution,” J. Appl. Phys. 110, 043723 and the references therein.CrossRefGoogle Scholar
Peral, I., McKinley, J., Knapp, M. and Ferrer, S, (2011). “Design and construction of multicrystal analyser detectors using Rowland circles: application to MAD26 at ALBA,” J. Synchrotron Radiat. 18, 842850.Google Scholar
Rius, J. (2011). “Direct phasing from Patterson syntheses by δ recycling,” Acta Crystallogr., Sect. A: Found. Crystallogr., A68, 7781.Google Scholar
Vallcorba, O., Rius, J., Frontera, C., Peral, I. and Miravitlles, C. (2012). “ DAJUST: a suite of computer programs for pattern matching, space-group determination and intensity extraction from powder diffraction data,” J. Appl. Crystallogr. 45, 844848 Google Scholar