Hostname: page-component-586b7cd67f-l7hp2 Total loading time: 0 Render date: 2024-11-27T23:32:17.628Z Has data issue: false hasContentIssue false

Influence of Grinding Methods on the 101 X-Ray Powder Diffraction line of α-Quartz

Published online by Cambridge University Press:  10 January 2013

Stefano Battaglia
Affiliation:
Institute of Mineral Treatments-C.N.R., Via Bolognola, 7 00138 Rome, Italy
Marco Franzini
Affiliation:
Department of Earth Sciences, University of Pisa, Via S.Maria 53, 56100 Pisa, Italy
Leonardo Leoni
Affiliation:
Department of Earth Sciences, University of Pisa, Via S.Maria 53, 56100 Pisa, Italy

Abstract

The influence of grinding procedures on the intensity and full-width-half-maximum for the 101 line of the X-ray powder diffraction pattern for α-quartz has been investigated using samples of controlled grain size. Data collected on powders obtained by four dry grinding methods show substantial variations (up to 35%) in the quartz diffraction intensities. These variations are evident in the <5 μm size fractions and are attributed to the creation of different thickness of amorphous silica layers on quartz grains by grinding. This result suggests that optimum grinding conditions should be defined for quantitative X-ray diffraction analysis.

Type
Research Article
Copyright
Copyright © Cambridge University Press 1990

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

Altree-Williams, S., Byrnes, J.G.& Jordan, B.(1981). Analyst 106, 6975.CrossRefGoogle Scholar
Burns, J.H.and Bredig, M.A.(1956). J. Chem. Phys. 25, 1281.CrossRefGoogle Scholar
Burton, Y.J.(1966). Trans. Inst. Chem. Engrs. (London) 44, 3741.Google Scholar
Gonnell, H.W.(1928), Z.V.D.I. 72, 945950.Google Scholar
Gordon, R.L.and Harris, G.W.(1955). Nature 25, 1135.CrossRefGoogle Scholar
Henderson, J.H., Syevs, J.K.& Jackson, M.L.(1970). Isr. I. Chem. 8, 357372.CrossRefGoogle Scholar
Jamieson, J.C.and Goldsmith, J.R.(1960). Am. Mineral. 45, 818827.Google Scholar
Klug, H.P.and Alexander, L.E.(1974). X-Ray Diffraction Procedures for Poly crystalline and Amorphous Materials, 2nded., 356368. New York: J. Wiley and Sons.Google Scholar
Laws, W.D.and Page, J.B.(1946). Soil Sci. 62, 319336.CrossRefGoogle Scholar
Lin, I.J., Nadiv, S.and Grodzian, D.J.M.(1975). Minerals Sci. Engng: 7,(4) 313336.Google Scholar
Lin, I.J., & Somasundaran, P.(1972). Powder Technology 6, 171178.CrossRefGoogle Scholar
Menyhart, M.& Miskiewicz, L.(1976). Powder Technology 15, 261266.CrossRefGoogle Scholar
O'Connor, B.H.and Chang, W.J.(1986). X-Ray Spectrom. 15, 267270.CrossRefGoogle Scholar
Ray, R.C.(1923), Proc. Roy. Soc. London A102, 640642.Google Scholar
Wilchinsky, Z.W.(1951). Acta Crystallogr. 4, 19.CrossRefGoogle Scholar