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Grazing incidence X-ray diffraction measurement of silver nanoparticles in metal-assisted etching of silicon

Published online by Cambridge University Press:  01 June 2020

Yunhui Tang Open the ORCID record for Yunhui Tang [Opens in a new window] ,
Bo Wang ,
Rui Xue  and
Hui Yan
Yunhui Tang
Affiliation:
College of Material Sciences and Engineering, Beijing University of Technology, Beijing100124, P. R. China
Bo Wang*
Affiliation:
College of Material Sciences and Engineering, Beijing University of Technology, Beijing100124, P. R. China
Rui Xue
Affiliation:
College of Material Sciences and Engineering, Beijing University of Technology, Beijing100124, P. R. China
Hui Yan
Affiliation:
College of Material Sciences and Engineering, Beijing University of Technology, Beijing100124, P. R. China
*
a)Author to whom correspondence should be addressed. Electronic mail: [email protected]
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Abstract

Silicon nanowires (SiNWs) were fabricated in a metal-assisted chemical etching method with two steps including dipping silicon wafers in AgNO3/HF solutions and then in H2O2/HF solutions. Grazing incidence X-ray diffraction measurements with a set of incidence angles were carried out on the resulting samples to detect characteristics of silver nanoparticles in the etched silicon. Compared with the uniform size of silver nanoparticles on the surface, the silver nanoparticles in etched silicon were found with size increasing and content decreasing corresponding to the depths. Based on the silver size increasing phenomenon, a detailed supplementary hypothesis about SiNWs formation was proposed about silver disintegration and redeposition in the later stage of silicon etching. For 2, 3, 4, and 8 mM AgNO3 solutions used to study their effect on the SiNWs, it was found that a higher quantity of Ag+ concentration such as 8 mM were not beneficial for producing good quality SiNWs.

Keywords

grazing incidence X-ray diffractionsilver nanoparticlesmetal-assisted chemical etchingsilicon nanowires
Type
Technical Article
Information
Powder Diffraction , Volume 35 , Issue 3 , September 2020 , pp. 178 - 184
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Copyright
Copyright © The Author(s), 2020. Published by Cambridge University Press on behalf of International Centre for Diffraction Data

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