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The generalized sin2ψ method: An advanced solution for X-ray stress analysis in textured materials

Published online by Cambridge University Press:  07 May 2014

A. Haase ,
M. Klatt ,
A. Schafmeister ,
R. Stabenow  and
B. Ortner
A. Haase
Affiliation:
GE Sensing & Inspection Technologies GmbH, SEIFERT Analytical X-ray, Bogenstrasse 41, 22926 Ahrensburg, Germany
M. Klatt
Affiliation:
GE Sensing & Inspection Technologies GmbH, SEIFERT Analytical X-ray, Bogenstrasse 41, 22926 Ahrensburg, Germany
A. Schafmeister
Affiliation:
GE Sensing & Inspection Technologies GmbH, SEIFERT Analytical X-ray, Bogenstrasse 41, 22926 Ahrensburg, Germany
R. Stabenow
Affiliation:
GE Sensing & Inspection Technologies GmbH, SEIFERT Analytical X-ray, Bogenstrasse 41, 22926 Ahrensburg, Germany
B. Ortner*
Affiliation:
Montanuniversität Leoben, Austria
*
a)Author to whom correspondence should be addressed. Electronic mail: [email protected]
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Abstract

Residual stress measurements on strongly textured materials using the standard sin2ψ evaluation show significant non-linearities. According to EN 15305 there is currently no existing solution for this problem. A method is presented that solves this problem. It is based on two tools. (i) The use of a one-dimensional detector having a large capture angle that yields the full diffraction profiles at each point of the pole figures. Therefore, some hundreds of d-values can be used for the stress calculation. (ii) Data evaluation with the recently developed generalized sin2ψ method. This has the advantage of being based on a flawless theory (Hooke's law in the special form of Dölle–Hauk's equation) and being able to handle any distribution of measurement directions and any number of measured data. The method was successfully tried out at a sheet of brass with significant texture.

Keywords

X-ray stress measurementTextureMatrix methodLinear detector
Type
Technical Articles
Information
Powder Diffraction , Volume 29 , Issue 2 , June 2014 , pp. 133 - 136
Copyright
Copyright © International Centre for Diffraction Data 2014 

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References

Baczmanski, A., Braham, C., and Seiler, W. (2003). “Microstresses in textured polycrystals studied by the multireflection diffraction method and self-consistent model,” Phil., Mag. 83, 3225–3246.Google Scholar
Dölle, H. (1979). “The influence of multiaxial stress states, stress gradients and elastic anisotropy on the evolution of (Residual) stresses by X-rays,” J. Appl. Crystallogr. 12, 489–501.Google Scholar
Dölle, H. and Hauk, V. (1979). “Röntgenographische Ermittlung von Eigenspannungen in texturierten Werkstoffen,” Z. Metallkde. 69, 682–685.Google Scholar
Hauk, V. (Ed.) (1997). Structural and Residual Stress Analysis by Nondestructive Methods (Elsevier, Amsterdam).Google Scholar
Ortner, B. (2009a). “Why should we give up the sin2psi method,” Adv. X-Ray Anal. 52, 763–772.Google Scholar
Ortner, B. (2009b). “Why we should give up the sin2psi method,” Powder Diffr. 24(2-suppl.), S16–S21.Google Scholar
Ortner, B. (2011). The Matrix Method for Data Evaluation and its Advantages in Comparison to the sin2psi and Similar Methods. Materials Science Forum 681 (Trans Tech Publications, Switzerland), pp. 7–12.Google Scholar
Skrzypek, S. J., Baczmanski, A., Ratuszeka, W., and Kusiorc, E. (2001). “New approach to stress analysis based on grazingincidence X-ray diffraction,” J. Appl. Crystallogr. 34, 427–435.Google Scholar
Tarkowski, L. (2004). “Optimization of X-ray pole figure measurement,” Mater. Sci. Forum 443–444, 137–140.Google Scholar