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F-45 SRM 2855 Additive Elements in Polyethylene WDXRF Analyses and Certification Approach

Published online by Cambridge University Press:  20 May 2016

J.R. Sieber
J.R. Sieber
Affiliation:
National Institute of Standards and Technology, Gaithersburg, MD
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Abstract

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Type
Denver X-Ray Conference
Information
Powder Diffraction , Volume 24 , Special Issue 2 , June 2009 , pp. 171
Copyright
Copyright © Cambridge University Press 2009

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