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Evaluation of expandability for randomly interstratified illite/smectite using interstratificational peak broadening

Published online by Cambridge University Press:  01 March 2012

Il Mo Kang ,
Myung Hun Kim ,
Youn Joong Kim ,
Hi-Soo Moon  and
Yungoo Song
Il Mo Kang
Affiliation:
Department of Earth System Sciences, Yonsei University, 134, Shinchon-dong, Seodaemun-ku, Seoul, 120-749, Korea
Myung Hun Kim
Affiliation:
Department of Chemistry, Yonsei University, 134, Shinchon-dong, Seodaemun-ku, Seoul, 120-749, Korea
Youn Joong Kim
Affiliation:
Division of Nano-Material and Environmental Science, Korea Basic Science Institute, Taejon, 305-333, Korea
Hi-Soo Moon*
Affiliation:
Department of Earth System Sciences, Yonsei University, 134, Shinchon-dong, Seodaemun-ku, Seoul, 120-749, Korea
Yungoo Song
Affiliation:
Department of Earth System Sciences, Yonsei University, 134, Shinchon-dong, Seodaemun-ku, Seoul, 120-749, Korea
*
a)Author to whom correspondence should be addressed. Electronic mail: [email protected]
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Abstract

This study attempted to quantify the interstratificational broadening of the randomly interstratified illite/smectite (random I∕S) basal reflection and to evaluate the percentage of the interstratified illite layers (%I) from the result. The interstratificational broadening was quantified using the distributional discrepancy (D) defined as D=[∑t∣ft(obs)−ft(ref)∣]∕2, where ft(obs) is the frequency of a crystallite containing thickness, t (the number of layers), measured from a basal reflection broadened by interstratifications, and ft(ref) is the frequency for a basal reflection with no interstratificational broadening. The basal reflections at 5.2° 2θ under glycolation and 8.84° 2θ under thermal dehydration provided the ft(obs) and ft(ref) of random I∕S. The linear relation, D=2.17%I+2.49(0⩽%I⩽30), was obtained from simulations for SWy-2 (Wyoming, USA).

Keywords

smectiteilliteI∕Sinterstratificationspeak broadeningcrystallite thickness
Type
Technical Articles
Information
Powder Diffraction , Volume 20 , Issue 3 , September 2005 , pp. 230 - 232
Copyright
Copyright © Cambridge University Press 2005

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