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D-89 Invited—Six Ways of Determining Film Thickness from High Resolution XRD Data

Published online by Cambridge University Press:  20 May 2016

A.J. Ying ,
I.C. Noyan  and
C.E. Murray
A.J. Ying
Affiliation:
Columbia University, New York, NY
I.C. Noyan
Affiliation:
Columbia University, New York, NY
C.E. Murray
Affiliation:
IBM T. J. Watson Research Laboratory, Yorktown Heights, NY
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Abstract

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Type
Denver X-Ray Conference
Information
Powder Diffraction , Volume 24 , Special Issue 2 , June 2009 , pp. 171
Copyright
Copyright © Cambridge University Press 2009

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