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D-61 Invited—Toward Nanometer Resolution for Strain Mapping in Single Crystals: New Focusing Optics and Dynamical Diffraction Artifacts

Published online by Cambridge University Press:  20 May 2016

H. Yan ,
H. C. Kang ,
J. Maser ,
A. T. Macrander ,
C. Liu ,
R. Conley ,
G. B. Stephenson ,
I. C. Noyan  and
O. Kalenci
H. Yan
Affiliation:
Argonne National Laboratory, Argonne, IL
H. C. Kang
Affiliation:
Argonne National Laboratory, Argonne, IL
J. Maser
Affiliation:
Argonne National Laboratory, Argonne, IL
A. T. Macrander
Affiliation:
Argonne National Laboratory, Argonne, IL
C. Liu
Affiliation:
Argonne National Laboratory, Argonne, IL
R. Conley
Affiliation:
Argonne National Laboratory, Argonne, IL
G. B. Stephenson
Affiliation:
Argonne National Laboratory, Argonne, IL
I. C. Noyan
Affiliation:
Columbia University, New York, NY
O. Kalenci
Affiliation:
Columbia University, New York, NY
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Abstract

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Type
Denver X-Ray Conference
Information
Powder Diffraction , Volume 22 , Issue 2 , June 2007 , pp. 180
Copyright
Copyright © Cambridge University Press 2007

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