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D-14 Utilizing the Debye Equation in Nanomaterial Line Profile Analysis

Published online by Cambridge University Press:  20 May 2016

K. Beyerlein ,
R.L. Snyder  and
P. Scardi
K. Beyerlein
Affiliation:
Georgia Institute of Technology, Atlanta, GA and University of Trento, Trento, Italy
R.L. Snyder
Affiliation:
Georgia Institute of Technology, Atlanta, GA
P. Scardi
Affiliation:
University of Trento, Trento, Italy
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Abstract

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Type
Denver X-Ray Conference
Information
Powder Diffraction , Volume 24 , Special Issue 2 , June 2009 , pp. 165
Copyright
Copyright © Cambridge University Press 2009

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