Hostname: page-component-cd9895bd7-jn8rn Total loading time: 0 Render date: 2024-12-26T16:49:12.273Z Has data issue: false hasContentIssue false
  • English
  • Français

D103 Generating high brilliance X-ray beams for analytical and metrology applications

Published online by Cambridge University Press:  20 May 2016

P. Boulée ,
D. Cenda  and
P. Høghøj
P. Boulée
Affiliation:
Xenocs SA, Sassenage, France
D. Cenda
Affiliation:
Xenocs SA, Sassenage, France
P. Høghøj
Affiliation:
Xenocs SA, Sassenage, France
Get access Rights & Permissions [Opens in a new window]

Abstract

An abstract is not available for this content so a preview has been provided. Please use the Get access link above for information on how to access this content.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Denver X-Ray Conference
Information
Powder Diffraction , Volume 21 , Issue 2 , June 2006 , pp. 178
Copyright
Copyright © Cambridge University Press 2006

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)