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D089 X-ray Line Profile Analysis for Microstructural Characterization of Nanomaterials—Invited

Published online by Cambridge University Press:  20 May 2016

I. Dragomir-Cernatescu
I. Dragomir-Cernatescu
Affiliation:
Georgia Institute of Technology, Atlanta, GA
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Abstract

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Type
Denver X-Ray Conference
Information
Powder Diffraction , Volume 20 , Issue 2 , June 2005 , pp. 182
Copyright
Copyright © Cambridge University Press 2005

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