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Corrugations of the basal planes in hexagonal boron nitride and their impact on the phase transition to cubic boron nitride

Published online by Cambridge University Press:  22 April 2015

C. Schimpf ,
M. Schwarz ,
C. Lathe ,
E. Kroke  and
D. Rafaja
C. Schimpf*
Affiliation:
TU Bergakademie Freiberg, Institute of Materials Science, G.-Zeuner-Straße 5, 09599 Freiberg, Germany
M. Schwarz
Affiliation:
TU Bergakademie Freiberg, Institute of Inorganic Chemistry, Leipziger Straße 29, 09599 Freiberg, Germany
C. Lathe
Affiliation:
Helmholtz Centre Potsdam, GFZ German Research Centre for Geosciences, Potsdam, Germany
E. Kroke
Affiliation:
TU Bergakademie Freiberg, Institute of Inorganic Chemistry, Leipziger Straße 29, 09599 Freiberg, Germany
D. Rafaja
Affiliation:
TU Bergakademie Freiberg, Institute of Materials Science, G.-Zeuner-Straße 5, 09599 Freiberg, Germany
*
a) Author to whom correspondence should be addressed. Electronic mail: [email protected]
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Abstract

Among the microstructure defects in hexagonal graphitic boron nitride, the basal plane corrugations are of high relevance for the sp2 to sp3 phase transition under high pressures (HP) and high temperatures (HT). A microstructure model is described, which is capable of quantifying the amplitude of the basal plane corrugations on the basis of the anisotropic X-ray diffraction line broadening. It is illustrated that this model correctly reproduces the specific shape of the diffraction lines from corrugated basal planes, i.e., the characteristic splitting of the 00l peaks. The results from XRD are verified by direct observation in the transmission electron microscope with high resolution. Subsequent HP/HT experiments were performed in order to highlight the difference in the phase transition kinetics between hexagonal boron nitride samples with different amount of basal plane corrugations. The effect of these microstructure defects on the conversion rate and on the obtained synthesis product is discussed.

Keywords

high pressurehigh temperaturephase transformationmicrostructure analysisX-ray diffractiontransmission electron microscopy
Type
Technical Articles
Information
Powder Diffraction , Volume 30 , Supplement S1 , June 2015 , pp. S90 - S96
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Copyright
Copyright © International Centre for Diffraction Data 2015 

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