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C-5 Absolute Thickness Determination of SMCO Films on Silicon Substrates Utilizing X-ray Diffraction and Their Composition Measurements By EXRF

Published online by Cambridge University Press:  20 May 2016

I. Vander  and
F.J. Cadieu
I. Vander
Affiliation:
Queens College CUNY, Flushing, NY
F.J. Cadieu
Affiliation:
Queens College CUNY, Flushing, NY
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Abstract

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Type
Denver X-Ray Conference
Information
Powder Diffraction , Volume 24 , Special Issue 2 , June 2009 , pp. 172
Copyright
Copyright © Cambridge University Press 2009

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