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C-16 High Energy XRD/XRF for High-Throughput Analysis of Composition Spread Thin Films

Published online by Cambridge University Press:  20 May 2016

J. M. Gregoire  and
R. B. van Dover
J. M. Gregoire
Affiliation:
Cornell University, Ithaca, NY
R. B. van Dover
Affiliation:
Cornell University, Ithaca, NY
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Abstract

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Type
Denver X-Ray Conference
Information
Powder Diffraction , Volume 24 , Special Issue 2 , June 2009 , pp. 164
Copyright
Copyright © Cambridge University Press 2009

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