Book Review - R. L. Snyder, J. Fiala, and H. J. Bunge: “Defect and Microstructure Analysis by Diffraction,” International Union of Crystallography (Oxford University Press, New York, 1999), ISBN 0 19 850189 7.

Pavol Šutta

doi:10.1017/S0885715600021503

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Book Review - R. L. Snyder, J. Fiala, and H. J. Bunge: “Defect and Microstructure Analysis by Diffraction,” International Union of Crystallography (Oxford University Press, New York, 1999), ISBN 0 19 850189 7.

Volume 15, Issue 3
Pavol Šutta
DOI: https://doi.org/10.1017/S0885715600021503

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Book Review - R. L. Snyder, J. Fiala, and H. J. Bunge: “Defect and Microstructure Analysis by Diffraction,” International Union of Crystallography (Oxford University Press, New York, 1999), ISBN 0 19 850189 7.

Volume 15, Issue 3
Pavol Šutta
DOI: https://doi.org/10.1017/S0885715600021503

To save this article to your Google Drive account, please select one or more formats and confirm that you agree to abide by our usage policies. If this is the first time you used this feature, you will be asked to authorise Cambridge Core to connect with your Google Drive account. Find out more about saving content to Google Drive.

Book Review - R. L. Snyder, J. Fiala, and H. J. Bunge: “Defect and Microstructure Analysis by Diffraction,” International Union of Crystallography (Oxford University Press, New York, 1999), ISBN 0 19 850189 7.

Volume 15, Issue 3
Pavol Šutta
DOI: https://doi.org/10.1017/S0885715600021503

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Book Review - R. L. Snyder, J. Fiala, and H. J. Bunge: “Defect and Microstructure Analysis by Diffraction,” International Union of Crystallography (Oxford University Press, New York, 1999), ISBN 0 19 850189 7.

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Book Review - R. L. Snyder, J. Fiala, and H. J. Bunge: “Defect and Microstructure Analysis by Diffraction,” International Union of Crystallography (Oxford University Press, New York, 1999), ISBN 0 19 850189 7.

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