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Application of micro-XRF for nuclear materials characterization and problem solving

Published online by Cambridge University Press:  16 April 2013

Christopher G. Worley ,
Lav Tandon ,
Patrick T. Martinez  and
Diana L. Decker
Christopher G. Worley*
Affiliation:
Los Alamos National Laboratory, MS G740, Los Alamos, New Mexico 87545
Lav Tandon
Affiliation:
Los Alamos National Laboratory, MS G740, Los Alamos, New Mexico 87545
Patrick T. Martinez
Affiliation:
Los Alamos National Laboratory, MS G740, Los Alamos, New Mexico 87545
Diana L. Decker
Affiliation:
Los Alamos National Laboratory, MS G740, Los Alamos, New Mexico 87545
*
a)Author to whom correspondence should be addressed. Electronic mail: [email protected]
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Abstract

A number of spatially resolved elemental imaging techniques are commonly employed to examine plutonium and other nuclear materials (e.g., scanning electron microscopy). Up until the past 10–15 years, micro-X-ray fluorescence (MXRF) instrumentation had been relatively uncommon, and even currently, it is underutilized for spatially resolved nuclear materials analysis and imaging. In the current study, a number of plutonium materials problem solving applications are presented to demonstrate the power and utility of MXRF for providing unique, spatially resolved elemental composition information. Applications discussed include identification of multiple insoluble fractions in plutonium and neptunium mixed oxide, spatially resolved imaging of plutonium residue and other elements on surface swipes, and spatial mapping of impurities in plutonium metal. The mixed oxide particle analysis demonstrated the ability to non-destructively identify particles of interest for potential extraction and analysis by other methods. The surface swipes study demonstrated the unique ability of MXRF to non-destructively image large multiple cm2 sized, non-conducting, radiologically contaminated samples. The plutonium metal investigation showed the capability of MXRF to non-destructively map elemental heterogeneity directly in an actinide matrix. Such information is extremely valuable prior to using destructive analysis (DA) trace elemental analytical chemistry techniques. If a metal is found to contain significant elemental impurity heterogeneity by MXRF, time consuming destructive sample preparation and analysis do not need to be repeated to confirm that the sample is indeed heterogeneous.

Keywords

micro-X-ray fluorescenceelemental mappingnuclear materialsradiologically contaminated samplesplutonium and neptunium mixed oxide
Type
Technical Articles
Information
Powder Diffraction , Volume 28 , Issue 2 , June 2013 , pp. 127 - 131
Copyright
Copyright © International Centre for Diffraction Data 2013 

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References

Nichols, M. C., Boehme, D. R., Ryon, R. W., Wherry, D., Cross, B., and Aden, G. (1987). “Parameters affecting X-ray microfluorescence (XRMF) analysis,” Adv. X-ray Anal. 30, 45–51.Google Scholar
Ranebo, Y., Eriksson, M., Tamborini, G., Nigolova, N., Bildstein, O., and Betti, M. (2007). “The use of SIMS and SEM for the characterization of individual particles with a matrix originating from a nuclear weapon,” Microsc. Microanal. 13, 179–190.CrossRefGoogle ScholarPubMed
Reed, S. J. B. (Ed.) (1993). Electron Microprobe Analysis (Cambridge University Press, New York, NY.)Google Scholar
Schoonover, J. R. and Havrilla, G. J. (1999). “Combining X-ray fluorescence spectrometry and vibrational microscopy to assess highly heterogeneous, actinide-contaminated materials,” Appl. Spectrosc. 53, 257–265.CrossRefGoogle Scholar
Scott, V. D., Love, G., and Reed, S. J. B. (Eds.) (1995). Quantitative Electron-Probe Microanalysis (Ellis Horwood, New York, NY.)Google Scholar
Worley, C. G. and Havrilla, G. J. (2001). “Quantification of large scale micro-X-ray fluorescence elemental images,” Appl. Spectrosc. 55, 1448–1454.CrossRefGoogle Scholar