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An external standard method for angular calibration of powder diffractometers

Published online by Cambridge University Press:  10 January 2013

Wu Wanguo  and
Ruan Yuzhong
Wu Wanguo
Affiliation:
Central Laboratory, Fuzhou University, Fuzhiou, Fujian, China
Ruan Yuzhong
Affiliation:
Central Laboratory, Fuzhou University, Fuzhiou, Fujian, China
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Abstract

An external standard method using mica for angular calibration of powder diffractometers is described. This is useful especially when standard referee materials certified by the US National Institute of Standards and Technology are not accessible.

Keywords

external standardmica
Type
Technical Articles
Information
Powder Diffraction , Volume 15 , Issue 3 , September 2000 , pp. 173 - 174
Copyright
Copyright © Cambridge University Press 2000

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References

Blanton, T. N. et al. (1995). “JCPDS-International Centre for Diffraction Data Round Robin Study of Silver Behenate. A Possible Low-angle X-ray Diffraction Calibration Standard,” Powder Diffr. 10, 91–95.CrossRefGoogle Scholar
Huang, T. C., Totraya, H., Blanton, T. N., and Wu, Y. (1993). “X-ray Powder Diffraction Analysis of Silver Behenate. A Possible Low-angle Diffraction Standard,” J. Appl. Crystallogr. 26, 180–184.Google Scholar
Klug, H. P., and Alexander, L. E. (1974). X-ray Diffraction Procedures for Polycrystalline and Amorphous Materials, 2nd ed. (Wiley, New York), pp. 594–597.Google Scholar
Wong-Ng, W., and Hubbrad, C. R. (1987). “Standard Reference Materials for X-ray Diffraction. II. Calibration Using d-spacing Standards,” Powder Diffr. 2, 242–248.CrossRefGoogle Scholar