Hostname: page-component-586b7cd67f-l7hp2 Total loading time: 0 Render date: 2024-11-30T16:59:33.463Z Has data issue: false hasContentIssue false
  • English
  • Français

X-Ray Powder Diffraction Analysis of a Photoconductor Material p-Diethylaminobenzaldehyde Diphenylamine Hydrazone

Published online by Cambridge University Press:  10 January 2013

T. C. Huang  and
P. W. Wang
T. C. Huang
Affiliation:
IBM Research Division, Almaden Research Center, 650 Harry Road, San Jose, CA 95120-6099, U.S.A.
P. W. Wang
Affiliation:
IBM Research Division, Almaden Research Center, 650 Harry Road, San Jose, CA 95120-6099, U.S.A.
Get access Rights & Permissions [Opens in a new window]

Abstract

A commercially available photoconductor material, p-diethylaminobenzaldehyde diphenylamine hydrazone, C23H25N3, has been purified and recrystallized from an absolute alcohol solution. The triclinic compound has been characterized by X-ray powder diffraction. Experimental 2θ values corrected for systematic errors, relative peak intensities, values of d, and the Miller indices of 74 observed reflections with 2θ up to 30.5° are reported. The powder diffraction data have been evaluated, and figures of merit are reported. Unit-cell parameters least-squares refined from the 74 observed reflections of the triclinic compound are in good agreement with those obtained from the single-crystal structure analysis.

Type
Research Article
Information
Powder Diffraction , Volume 4 , Issue 4 , December 1989 , pp. 206 - 208
Copyright
Copyright © Cambridge University Press 1989

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

Garvey, R.G. (1989). Personal computer version of the program NBS*AIDS83. Swarthmore, PA: International Centre for Diffraction Data.Google Scholar
Huang, T.C. & Parrish, W. (1984). In Adv. X-Ray Anal. 27, 45.Google Scholar
Mighell, A.D., Hubbard, C.R. & Stalick, J.K. (1981). NBS*AIDS80: A FORTRAN Program for crystallographic data evaluation. NBS (U.S.) Tech. Note 1141. Gaithersburg, MD 20899: U.S. Dept. of Commerce, Natl. Bur. Stand.CrossRefGoogle Scholar
Pacansky, J. (1980). IBM Research Report, RJ-2902, IBM Thomas J. Watson Research Center, Distribution Services, P.O. Box 218, Yorktown Heights, NY 10598.Google Scholar
Parrish, W. & Huang, T.C. (1980). In Accuracy in Powder Diffraction, eds. Block, S. & Hubbard, C.R.. NBS Spec. Publ. 567, pp 95–110. Gaithersburg, MD 20899: U.S. Dept. of Commerce, Natl. Bur. Stand.Google Scholar
Smith, D.K. (1968). Norelco Reporter XV, 57;Google Scholar
Borg, I.Y. & Smith, D.K. (1969). Calculated X-Ray Powder Patterns for Silicate Minerals. Boulder, CO: Geological Society of America.CrossRefGoogle Scholar
Smith, G.S. & Snyder, R.L. (1979). FN: A criterion for rating powder diffraction patterns and evaluating the reliability of powder pattern indexing. J. Appl. Crystallogr. 12, 60–65.CrossRefGoogle Scholar
Wolff, P.M. de (1968). A simplified criterion for the reliability of a powder pattern indexing. J. Appl. Crystallogr. 1, 108–113.CrossRefGoogle Scholar