Hostname: page-component-cd9895bd7-gxg78 Total loading time: 0 Render date: 2024-12-24T05:06:37.675Z Has data issue: false hasContentIssue false
  • English
  • Français

Total scattering experiments on glass and crystalline materials at the ESRF on the ID11 Beamline

Published online by Cambridge University Press:  22 December 2014

Andrea Bernasconi ,
Jonathan Wright  and
Nicholas Harker
Andrea Bernasconi*
Affiliation:
ESRF – The European Synchrotron – Grenoble, France
Jonathan Wright
Affiliation:
ESRF – The European Synchrotron – Grenoble, France
Nicholas Harker
Affiliation:
ESRF – The European Synchrotron – Grenoble, France
*
a) Author to whom correspondence should be addressed. Electronic mail: [email protected]
Get access Rights & Permissions [Opens in a new window]

Abstract

ID11 is a multi-purpose high-energy beamline at the European Synchrotron Radiation Facility (ESRF). Owing to the high-energy X-ray source (up to 140 keV) and flexible, high-precision sample mounting which allows small sample–detector distances to be achieved, experiments such as total scattering in transmission geometry are possible. This permits the exploration of a wide Q range and so provides high real-space resolution. A range of samples (glasses and crystalline powders) have been measured at 78 keV, first putting the detector as close as possible to the sample (~10 cm), and then moving it vertically and laterally with respect to the beam in order to have circular and quarter circle sections of diffraction rings, with consequent Q MAX at the edge of the detector of about 16 and 28 Å−1, respectively. Data were integrated using FIT2D, and then normalized and corrected with PDFgetX3. Results have been compared to see the effects of Q-range and counting statistics on the atomic pair distribution functions of the different samples. A Q of at least 20 Å−1 was essential to have sufficient real-space resolution for both type of samples while statistics appeared more important for glass samples rather than for crystalline samples.

Keywords

PDFsynchrotronglasscrystalline
Type
Technical Articles
Information
Powder Diffraction , Volume 30 , Supplement S1 , June 2015 , pp. S2 - S8
Check for updates
Copyright
Copyright © International Centre for Diffraction Data 2014 

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

Billinge, S. J. L. (2009). “Local structure from total scattering and atomic pair distribution function (PDF) analysis,” in Powder Diffraction: Theory and Practice, edited by Dinnebier, R. E. and Billinge, S. J. L. (The Royal Society of Chemistry, Cambridge), Chapter 16, pp. 464–493.Google Scholar
Bowron, D. T., Soper, A. K., Jones, K., Ansell, S., Birch, S., Norris, J., Perrott, D., Riedel, D., Rhodes, N. J., Wakefield, S. R., Botti, A., Ricci, M. A., Grazzi, F., and Zoppi, M. (2010). “NIMROD: the near and intermediate range order diffractometer of the ISIS second target station,” Rev. Sci. Instrum. 81, 033905.Google Scholar
Cassingham, N. J., Stennet, M. C., Bingham, P. A., Hyatt, N. C., and Aquilanti, G. (2011). “The structural role of Zn in nuclear waste glasses,” Int. J. Appl. Glass Sci. 2(4), 343–353.CrossRefGoogle Scholar
Farrow, C. L., Juhas, P., Liu, J. W., Bryndin, D., Bozin, E. S., Bloch, J., Proffen, Th., and Billinge, S. J. L. (2009). “PDFfit2 and PDFgui: computer programs for studying nanostructure in crystals,” J. Phys. Condens. Matter 19, 335219.Google Scholar
Hammersley, A. P., Svensson, S. O., Hanfland, M., Fitch, A. N., and Hausermann, D. (1996). “Two-dimensional detector software: from real detector to idealized image or two-theta scan,” High Press. Res. 14, 235–248.Google Scholar
Hong, X., Chen, Z., and Duffy, T. S. (2012). “Absolute x-ray energy calibration over a wide energy range using a diffraction-based iterative method,” Rev. Sci. Instrum. 83, 063901.CrossRefGoogle Scholar
Kahn, R., and Fourme, R. (1982). “Macromolecular crystallography and polarization correction,” J. Appl. Crystallogr. 15, 330–337.Google Scholar
Juhas, P., Davis, T., Farrow, C. L., and Billinge, S. J. L. (2013). “PDFgetX3: a rapid and highly automatable program for processing powder diffraction data into total scattering pair distribution functions,” J. Appl. Crystallogr. 46, 560–566.Google Scholar
Labiche, J. C., Mathon, O., Pascarelli, S., Newton, M. A., Ferre, G. G., Curfs, C., Vaughan, G., Homs, A., and Carreira, D. F. (2007). “Invited article: the fast readout low noise camera as a versatile x-ray detector for time resolved dispersive extended x-ray absorption fine structure and diffraction studies of dynamic problems in materials science, chemistry, and catalysis,” Rev. Sci. Instrum. 78, 091301.Google Scholar
Masadeh, A. S., Bozin, E. S., Farrow, C. L., Paglia, G., Juhas, P., Billinge, S. J. L, Karkamkar, A., and Kanatzidis, M. G. (2007). “Quantitative size-dependent structure and strain determination of CdSe nanoparticles using atomic pair distribution function analysis,” Phys. Rev. B 76, 115413.Google Scholar
Ponchut, C. (2006). “Characterization of X-ray area detectors for synchrotron beamlines,” J. Synchrotron Radiat. 13, 195–203.Google Scholar
Wu, G., Rodrigues, B. L., and Coppens, P. (2002). “The correction of reflection intensities for incomplete absorption of high-energy X-rays in the CCD phosphor,” J. Appl. Crystallogr. 35, 356–359.Google Scholar
Wyckoff, R. W. G. (1963). American Mineralogist Crystal Structure Database.Google Scholar
Xu, Y. N. and Ching, W. Y. (1993). American Mineralogist Crystal Structure Database.Google Scholar